What's New in the Compact Test Kit (Compact 7)


The Windows Embedded Compact Test Kit (CTK) is a new application with the following key features:

  • Improved user interface that resembles Microsoft Visual Studio
  • Ability to group user-selected test cases into test passes
  • Improved test results viewer allows you store and review test results per test pass
  • Upon connection to a device, detection of peripherals and drivers needed for tests
  • Integration with the new Graph Tool to graph performance test results
  • Automated test passes using the new Windows Embedded Compact Test Kit (CTK) Automation Tool Solution (CATS) tool
  • Stress testing using the new Compact Stress tool
  • Ability to add custom Tux test harness (TUX)-based tests to the CTK
  • Support for x86, MIPSII, MIPSII_FP, ARMv5, ARMv6, ARMv7, and SH4 processors

See Also


Compact Test Kit Overview