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Open and Close Test

Command-line parameter: /oc

During the Open and Close Test, Device Path Exerciser creates several threads, each of which performs thousands of create-open-close sequences. This tests the driver's ability to handle an extraordinary volume of otherwise simple and anticipated calls.

The Open and Close Test uses the same options used in Basic Open Operations and Open with Added Backslash tests and are performed just prior to these tests.

 

 

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Build date: 9/28/2012