Command Line Parameters for the Storage Device Block Driver Benchmark Test
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8/27/2008
The Storage Device Block Driver Benchmark Test analyzes the performance of a storage device in reading and writing. The test scans a storage device and attempts to read from and write to every sector on the device. The test displays information about the time required to complete each operation.
The Storage Device Block Driver Benchmark Test executes the tux –o –d rw_all command line on default execution.
Syntax
tux –o –d rw_all -zorch [-disk DSKX:] [-profile <profile>]
[-oldioctls] [-store]
Parameters
- -o
This parameter sends all Kato output to the debugger.
- -d rw_all
This parameter allows the Tux client to load one or more default test modules. When you pass in therw_alloption, the Tux client loadsrw_allmodule and immediately begins to execute the specified tests forrw_all.
-disk DSK X :
Specifies the device name of the disk to test.If you do not specify this parameter, the test probes for a mass storage disk on devices DSK1-DSK9. Specifying this parameter overrides the automatic detection process and forces the test to use the disk that you specify.
-profile < profile >
Limits testing to the devices with the specified storage profile.The default storage profile is "all profiles".
-oldioctls
Forces the test to use the previous disk I/O control codes (IOCTLs) instead of the current set of IOCTLs.The previous IOCTLs are all prefixed with "DISK_IOCTL_" and are not Windows Embedded CE IOCTLs. The current set IOCTLs are prefixed with "IOCTL_DISK_." Many block drivers support both previous and current IOCTLs.
You can use this parameter to verify that current and previous IOCTLs work correctly.
-store
Specifies that the test opens a handle to the disk by using the OpenStore function instead of the CreateFile function.Notice that you are not required to open a handle by using OpenStore in order to test block driver functionality. However, it is useful for testing a storage device that Filesys.exe loads automatically if you cannot open the storage device as a stream device. For example, you can open a handle to a flash driver for ROM by using the OpenStore function.
- -zorch
Enables the functionality of the test. Without this parameter, the test will fail. With this parameter, the test will run and destroy all data on the storage devices.
Remarks
Prior to running this test, be aware that all information on the storage device is destroyed. The test writes to and reads from every sector on the storage device without preserving the contents of the storage device. The test tests each PC Card that is inserted in the system, assigning one thread to each card. Microsoft recommends that you back up data on all cards and disks that are attached to the tested device before running the test.
If you run the unmodified test, it will fail. In the results file, you will see a message warning you to back up data on all cards and disks that are attached to the testing device before running the test. Then, it instructs you to modify the command line by right-clicking on the test in the Windows Embedded CE 6.0 Test Kit (CETK) tree control, choosing Edit Command Line, and adding the following switch to the command line:
-zorch
After saving your changes, you can run the test successfully. You can also pass this parameter in with Tux's -c command line parameter.
There are no other command line parameters for this test.