OAL Tests (Windows Embedded CE 6.0)
1/6/2010
This section provides information about the OEM Adaptation Layer (OAL) tests in the Windows Embedded CE Test Kit.
In This Section
- OAL Cache Tests
CETK tests that assess the cache and memory subsystem of a Windows Embedded CE powered device
- OAL Interrupt Tests
CETK tests for the OAL interrupt
- OAL IOCTL Tests
CETK tests for OAL IOCTLs
- OAL KITL Tests
CETK tests for the OAL KITL
- OAL Timer Tests
CETK tests for OAL timers