Sleep Tests (Device Fundamentals)

The Device Fundamentals Sleep tests run I/O and PnP operations on the specified devices, before and after, or during system sleep state transitions. The Sleep tests ensure that the device under test permits the system to be cycled through all of the supported sleep states. Additionally, it ensures that the device is still functional after these state changes through Simple I/O stress testing.

Sleep tests

Test Description

Critical Sleep with I/O before and after

This test performs critical sleep state transitions on the system and performs I/O on devices before and after each sleep state cycle.

Test binary: Devfund_Critical_Sleep_With_IO_BeforeAndAfter.wsc

Test method: Critical_Reboot_Restart_With_IO_Before_And_After

Parameters: - see Device Fundamentals Test Parameters

DQ

TestCycles

ResumeDelay

IOPeriod

Critical Sleep with I/O during

This test performs critical sleep state transitions on the system and performs I/O on devices.

Test binary: Devfund_Critical_Sleep_With_IO_During.wsc

Test method: Critical_Sleep_With_IO_During

Parameters: - see Device Fundamentals Test Parameters

DQ

TestCycles

ResumeDelay

IOPeriod

Sleep and PNP (disable and enable) with I/O Before and After

This test cycles the system through various sleep states and performs I/O and basic PnP (disable/enable) on devices before and after each sleep state cycle.

For more information, see About the Sleep and PNP disable and enable with IO Before and After test.

Test binary: Devfund_Sleep_PNP_DisableEnable_With_IO_BeforeAndAfter.wsc

Test method: Sleep_PNP_DisableEnable_With_IO_Before_And_After

Parameters: - see Device Fundamentals Test Parameters

DQ

TestCycles

ResumeDelay

IOPeriod

Sleep with I/O Before and After

This test cycles the system through various sleep states and performs I/O on devices before and after each sleep state cycle.

For more information, see About the Sleep with IO Before And After test.

Test binary: Devfund_Sleep_With_IO_BeforeAndAfter.wsc

Test method: Sleep_With_Io_Before_And_After

Parameters: - see Device Fundamentals Test Parameters

DQ

TestCycles

ResumeDelay

IOPeriod

Sleep with I/O during

This test cycles the system through various sleep states and performs I/O on devices.

Test binary: Devfund_Sleep_With_IO_During.wsc

Test method: Sleep_With_IO_During

Parameters: - see Device Fundamentals Test Parameters

DQ

TestCycles

ResumeDelay

IOPeriod

About the Sleep and PNP disable and enable with IO Before and After test

This test does the following:

  1. Verifies that the test device and its descendants are not reporting any device problem codes.
  2. Tests I/O on the test device and its descendants using the WDTF Simple I/O plugins. See Provided WDTF Simple I/O plug-ins for more information.
  3. Sends the test system into its first supported sleep state and resumes the system from sleep after some time.
  4. Verifies that the test device and its descendants are not reporting any device problem codes.
  5. Tests I/O on the test device and its descendants using the WDTF Simple I/O plugins. See Provided WDTF Simple I/O plug-ins for more information.
  6. If the test device is can be disabled, the test disables and enables the test device using WDTF PnP action interfaces, see IWDTFPNPAction2::DisableDevice and IWDTFPNPAction2::EnableDevice methods for more information.
  7. Verifies that the test device and its descendants are not reporting any device problem codes.
  8. Tests I/O on the test device and its descendants using WDTF Simple I/O plugins. See Provided WDTF Simple I/O plug-ins for more information.
  9. Repeats step 3-8 for each supported sleep state of the test system.
  10. Repeats step 1-9 several times.

About the Sleep with IO Before And After test

This test does the following:

  1. Verifies that there are no devices on the system reporting device problem codes.
  2. Tests I/O on every device on the system using WDTF Simple I/O plugins. See Provided WDTF Simple I/O plug-ins for more information.
  3. Sends the test system into its first supported sleep state and resumes the system from sleep after some time.
  4. Verifies that there are no devices on the system reporting device problem codes.
  5. Tests I/O on every device on the system using WDTF Simple I/O plugins. See Provided WDTF Simple I/O plug-ins for more information.
  6. Repeats steps 3 - 5 for each supported sleep state of the test system.
  7. Repeats steps 1 - 6 several times.

How to How to test a driver at runtime using Visual Studio

How to select and configure the Device Fundamentals tests

Device Fundamentals Tests

Device Fundamentals Test Parameters

Provided WDTF Simple I/O plug-ins

How to test a driver at runtime from a Command Prompt

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